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Other - Test Clip Cable Assemblies

Fri, 17 Jun 2022 11:29:54 +0100

Other Cable Assembles for Test Clips

Bespoke cable assemblies for use with IC Test Clips or equipment.

Please get in touch if you have a requirement - Contact Us

PLCC Test Clip Cable Assemblies

Fri, 17 Jun 2022 11:28:20 +0100

PLCC Test Clip Cable Assemblies

Cable assemblies designed for use with PLCC IC Test Clips and interfacing with electronics test or programming equipment such as those made by ABI Electroncis, Diagnosys Astronics and Huntron.

SOIC Test Clip Cable Assemblies

Fri, 17 Jun 2022 11:26:16 +0100

SOIC Test Clip Cable Assemblies

Cable assemblies designed for use with SOIC IC Test Clips and interfacing with electronics test or programming equipment such as those made by ABI Electroncis, Diagnosys Astronics and Huntron.

DIL Test Clip Cable Assemblies

Fri, 17 Jun 2022 11:15:40 +0100

Cable Assemblies for DIL IC Test Clips

Cable assemblies designed to interface with test equipment from manufacturer such as ABI, Diagnosys or Huntron or to other test and programming equipment.

SOIC Test Clips

Fri, 10 Nov 2017 10:38:53 +0000

The SOIC Test Clip is specially designed for Small Outline Integrated Circuits (SOIC & SOJ) (IC's with a small circumference). Although the distance between pins at the end of the IC is only 1.27 mm (0,050''), a distance of 2.54 mm between pins is reached at the top of the clip. This pitch enables an easy attachment to the test clip ensuring that unnecessary short circuits are avoided. The standard 0.64 mm square pins enable an easy attaching of the respective connectors or hook/ grabber type probes.

PLCC Test Clips

Fri, 10 Nov 2017 10:38:30 +0000

Designed for testing surface mounted Plastic Leaded Chip Carrier (PLCC) style Integrated Circuits (ICs).

The AP Products version features a unique action wedge design with all four sides opening simultaneously provides a faster and easier attachment to the PLCC. The helical compression spring and insulating contact combs insure integrity in contact when testing. Our narrow body design allows components to be tested with as little as 2.54 mm (0.1") lead-to-lead spacing, side stackable at 0.200" lead to-lead spacing. Probe access points are immediately visible for fast and safe individual lead testing, while staggered contact rows on 0.100" centers allow for easy probe attachment and help prevent accidental shorting of adjacent probes, Industry standard 0.635 mm square contact pins permit easy attachment of female socket connectors or hook/ grabber style test probes.

The Pomona version features a patented lock-on design which attaches directly to the surface mounted IC and provides hands-free access to all of the chip leads. It has gold plated upper contacts to ensure noise free, low resistance connections. Gold plated lower contacts also ensure the best connection to chip leads. It also uses standard .025 square pins, staggered to use the least amount of space, will accept 0.025 sq contact receptacles, soldered wires or hook/ grabber style test connectors.

DIL Test Clips

Fri, 10 Nov 2017 10:37:46 +0000

Warwick Test Supplies manufacture AP Products DIL IC Test Clips in the UK, utilising the finest materials to ensure that the Test Clips are hard wearing and reliable in use.

A P Product DIL/DIP IC Test Clips are available from 8pin to 64pin with a range of pin contacts, the most popular being Knife Edge or Duck Bill made from steel alloy or gold. We also stock and provide the Pomona range of IC Test Clips.

With our range available, you are sure to find a DIL IC Test Clip that suits your connection requirement. If you are unsure which is best for you, then please feel free to email or call and talk with one of our advisers.